Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

• air using a length-extension resonator operating at small amplitudes. An additional slow feedback compensates for changes in the free resonance frequency, allowing stable imaging over a long period of time with changing environmental conditions. Keywords: ambient conditions; drift compensation

• . Experimental setup. a) Feedback scheme. The dashed parts enable the slow-drift compensation. Also shown is the LER soldered on a piece of a circuit board, which is glued to an L-shaped metal adapter piece. b) Image of the Cypher droplet holder with LER adapter piece fixed by two screws (white arrows). c